Nanothermal characterization of amorphous and crystalline phases in chalcogenide thin films with scanning thermal microscopy (2014)
Attributed to:
Non-Destructive Nanoscale Resolution using a Carbon Nanotube Scanning Thermal Probe
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4895493
Publication URI: http://dx.doi.org/10.1063/1.4895493
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 13