Nanoscale mapping of in situ actuating microelectromechanical systems with AFM (2015)
Attributed to:
Non-Destructive Nanoscale Resolution using a Carbon Nanotube Scanning Thermal Probe
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1557/jmr.2014.353
Publication URI: http://dx.doi.org/10.1557/jmr.2014.353
Type: Journal Article/Review
Parent Publication: Journal of Materials Research
Issue: 3