Built-in Reliability Design of Highly Integrated Solid-State Power Switches With Metal Bump Interconnects (2015)
Attributed to:
An Innovative Electronics Manufacturing Research Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2014.2357334
Publication URI: http://dx.doi.org/10.1109/tpel.2014.2357334
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Power Electronics
Issue: 5