XCT analysis of the influence of melt strategies on defect population in Ti-6Al-4V components manufactured by Selective Electron Beam Melting (2015)
Attributed to:
Multiscale x-ray imaging facility for monitoring and modelling structural evolution in situ
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.matchar.2015.02.008
Publication URI: http://dx.doi.org/10.1016/j.matchar.2015.02.008
Type: Journal Article/Review
Parent Publication: Materials Characterization