Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor Materials. (2015)
Attributed to:
Beyond Blue: New Horizons in Nitrides (Platform Grant Renewal)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927615000422
PubMed Identifier: 25926083
Publication URI: http://europepmc.org/abstract/MED/25926083
Type: Journal Article/Review
Volume: 21
Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Issue: 3
ISSN: 1431-9276