Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor Materials. (2015)

First Author: Tang F

Attributed to: Beyond Blue: New Horizons in Nitrides (Platform Grant Renewal) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927615000422

PubMed Identifier: 25926083

Publication URI: http://europepmc.org/abstract/MED/25926083

Type: Journal Article/Review

Volume: 21

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 3

ISSN: 1431-9276