Model-based defect detection on structured surfaces having optically unresolved features. (2015)

First Author: O'Connor D
Attributed to:  Metrology for precision and additive manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/ao.54.008872

PubMed Identifier: 26560373

Publication URI: http://europepmc.org/abstract/MED/26560373

Type: Journal Article/Review

Volume: 54

Parent Publication: Applied optics

Issue: 30

ISSN: 1559-128X