Quantitative analysis of electrically detected Ramsey fringes in P-doped Si (2015)
Attributed to:
Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.92.165310
Publication URI: http://dx.doi.org/10.1103/physrevb.92.165310
Type: Journal Article/Review
Parent Publication: Physical Review B
Issue: 16
ISSN: 1098-0121