Crystal field analysis of Dy and Tm implanted silicon for photonic and quantum technologies. (2014)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/oe.22.029292

PubMed Identifier: 25606863

Publication URI: http://europepmc.org/abstract/MED/25606863

Type: Journal Article/Review

Volume: 22

Parent Publication: Optics express

Issue: 24

ISSN: 1094-4087