Towards in-process x-ray CT for dimensional metrology (2016)
Attributed to:
Inside-out: Statistical methods for Computed Tomography validation of complex structures in Additive Layer Manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0957-0233/27/3/035401
Publication URI: http://dx.doi.org/10.1088/0957-0233/27/3/035401
Type: Journal Article/Review
Parent Publication: Measurement Science and Technology
Issue: 3