Electrical Test Structure for the Measurement of Hermeticity in Electronic and MEMS Packages With Small Cavity Volumes (2013)
Attributed to:
An Innovative Electronics Manufacturing Research Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tsm.2013.2271213
Publication URI: http://dx.doi.org/10.1109/tsm.2013.2271213
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Semiconductor Manufacturing
Issue: 3
ISSN: 0894-6507