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Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics (2012)

First Author: Yifan Li

Attributed to: An Innovative Electronics Manufacturing Research Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tsm.2012.2202770

Publication URI: http://dx.doi.org/10.1109/tsm.2012.2202770

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Semiconductor Manufacturing

Issue: 3

ISSN: 0894-6507