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Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. (2012)

First Author: Naresh-Kumar G

Attributed to: Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.108.135503

PubMed Identifier: 22540714

Publication URI: http://europepmc.org/abstract/MED/22540714

Type: Journal Article/Review

Volume: 108

Parent Publication: Physical review letters

Issue: 13

ISSN: 0031-9007