📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Certified ion implantation fluence by high accuracy RBS. (2015)

First Author: Colaux JL
Attributed to:  University of Surrey Ion Beam Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c4an02316a

PubMed Identifier: 25773724

Publication URI: http://europepmc.org/abstract/MED/25773724

Type: Journal Article/Review

Volume: 140

Parent Publication: The Analyst

Issue: 9

ISSN: 0003-2654