Dual-Sweep Frequency Scanning Interferometry Using Four Wave Mixing (2015)
Attributed to:
Novel Multi-target Distance Metrology for Multi-probe Application using Chirped Laser
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/lpt.2015.2390779
Publication URI: http://dx.doi.org/10.1109/lpt.2015.2390779
Type: Journal Article/Review
Parent Publication: IEEE Photonics Technology Letters
Issue: 7