Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction (2015)

First Author: Vilalta-Clemente A
Attributed to:  Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927615010235

Publication URI: http://ora.ox.ac.uk/objects/pubs:606772

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S3