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Characterization of Elastic Strain Field and Geometrically Necessary Dislocation Distribution in Stress Corrosion Cracking of 316 Stainless Steels by Transmission Kikuchi Diffraction (2015)

First Author: Vilalta-Clemente A

Attributed to: Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927615003827

Publication URI: http://dx.doi.org/10.1017/s1431927615003827

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S3