📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

High-resolution error detection in the capture process of a single-electron pump (2016)

First Author: Giblin S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4939250

Publication URI: http://dx.doi.org/10.1063/1.4939250

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 2