MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter (2016)

First Author: Stoytschew V
Attributed to:  Ambient Pressure Mass Spectrometry at the Sub Micron Scale funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nimb.2015.11.020

Publication URI: http://dx.doi.org/10.1016/j.nimb.2015.11.020

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms