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Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation

First Author: Campbell B

Attributed to: REMS: Rigorous Engineering for Mainstream Systems funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/978-3-319-10702-8_13

Publication URI: http://dx.doi.org/10.1007/978-3-319-10702-8_13

Type: Book Chapter

Book Title: Formal Methods for Industrial Critical Systems (2014)

Page Reference: 185-199

ISBN: 978-3-319-10701-1