Robustness and Balancing of Parallel-Connected Power Devices: SiC Versus CoolMOS (2016)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tie.2015.2500187
Publication URI: http://dx.doi.org/10.1109/tie.2015.2500187
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Industrial Electronics
Issue: 4