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Removing multiple outliers and single-crystal artefacts from X-ray diffraction computed tomography data (2015)

First Author: Vamvakeros A

Attributed to: EPSRC Impact Acceleration Fellowships at RCaH funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1107/s1600576715020701

Publication URI: http://dx.doi.org/10.1107/s1600576715020701

Type: Journal Article/Review

Parent Publication: Journal of Applied Crystallography

Issue: 6