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Characterization of InGaN and InAlN Epilayers by Microdiffraction X-Ray Reciprocal Space Mapping (2012)

First Author: Kachkanov V

Attributed to: Gallium nitride enabled hybrid and flexible photonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1557/opl.2012.216

Publication URI: http://dx.doi.org/10.1557/opl.2012.216

Type: Journal Article/Review

Parent Publication: MRS Proceedings