Characterization of InGaN and InAlN Epilayers by Microdiffraction X-Ray Reciprocal Space Mapping (2012)

First Author: Kachkanov V
Attributed to:  Gallium nitride enabled hybrid and flexible photonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1557/opl.2012.216

Publication URI: http://dx.doi.org/10.1557/opl.2012.216

Type: Journal Article/Review

Parent Publication: MRS Proceedings