Characterization of InGaN and InAlN Epilayers by Microdiffraction X-Ray Reciprocal Space Mapping (2012)
Attributed to:
Gallium nitride enabled hybrid and flexible photonics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1557/opl.2012.216
Publication URI: http://dx.doi.org/10.1557/opl.2012.216
Type: Journal Article/Review
Parent Publication: MRS Proceedings