Finite element modelling and experimental characterisation of paralleled SiC MOSFET failure under avalanche mode conduction (2015)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/epe.2015.7309180
Publication URI: http://dx.doi.org/10.1109/epe.2015.7309180
Type: Conference/Paper/Proceeding/Abstract