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3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling. (2015)

First Author: Bailey J

Attributed to: University of Nottingham - Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/am507663v

PubMed Identifier: 25562665

Publication URI: http://europepmc.org/abstract/MED/25562665

Type: Journal Article/Review

Volume: 7

Parent Publication: ACS applied materials & interfaces

Issue: 4

ISSN: 1944-8244