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Impact of active areas on electrical characteristics of TiO<inf>2</inf> based solid-state memristors (2015)

First Author: Li Q

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iscas.2015.7168601

Publication URI: http://dx.doi.org/10.1109/iscas.2015.7168601

Type: Conference/Paper/Proceeding/Abstract