Impact of active areas on electrical characteristics of TiO<inf>2</inf> based solid-state memristors (2015)
Attributed to:
Reliably unreliable nanotechnologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/iscas.2015.7168601
Publication URI: http://dx.doi.org/10.1109/iscas.2015.7168601
Type: Conference/Paper/Proceeding/Abstract