Conductive Atomic Force Microscopy Investigation of Switching Thresholds in Titanium Dioxide Thin Films (2015)
Attributed to:
Reliably unreliable nanotechnologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acs.jpcc.5b01672
Publication URI: http://dx.doi.org/10.1021/acs.jpcc.5b01672
Type: Journal Article/Review
Parent Publication: The Journal of Physical Chemistry C
Issue: 21