Conductive Atomic Force Microscopy Investigation of Switching Thresholds in Titanium Dioxide Thin Films (2015)

First Author: Trapatseli M

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acs.jpcc.5b01672

Publication URI: http://dx.doi.org/10.1021/acs.jpcc.5b01672

Type: Journal Article/Review

Parent Publication: The Journal of Physical Chemistry C

Issue: 21