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Nanoscale roughness micromilled silica evanescent refractometer. (2015)

First Author: Carpenter LG

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/oe.23.001005

PubMed Identifier: 25835860

Publication URI: http://europepmc.org/abstract/MED/25835860

Type: Journal Article/Review

Volume: 23

Parent Publication: Optics express

Issue: 2

ISSN: 1094-4087