Analysis of power device failure under avalanche mode Conduction (2015)

First Author: Alexakis P

Attributed to: Predictive Reliability Modelling and Characterization of Silicon Carbide Power MOS-Transistors in Grid-Connected Voltage Source Converters funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/icpe.2015.7168028

Publication URI: http://dx.doi.org/10.1109/icpe.2015.7168028

Type: Conference/Paper/Proceeding/Abstract