Improved Electrothermal Ruggedness in SiC MOSFETs Compared With Silicon IGBTs (2014)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2014.2323152
Publication URI: http://dx.doi.org/10.1109/ted.2014.2323152
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 7