Investigating the reliability of SiC MOSFET body diodes using Fourier series modelling (2014)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ecce.2014.6953427
Publication URI: http://dx.doi.org/10.1109/ecce.2014.6953427
Type: Conference/Paper/Proceeding/Abstract