Modeling of turn-OFF transient energy in IGBT controlled silicon PiN diodes (2014)

First Author: Jahdi S

Attributed to: Predictive Reliability Modelling and Characterization of Silicon Carbide Power MOS-Transistors in Grid-Connected Voltage Source Converters funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/epe.2014.6911007

Publication URI: http://dx.doi.org/10.1109/epe.2014.6911007

Type: Conference/Paper/Proceeding/Abstract