Electrothermal modeling and characterization of SiC Schottky and silicon PiN diodes switching transients (2014)

First Author: Jahdi S

Attributed to: Predictive Reliability Modelling and Characterization of Silicon Carbide Power MOS-Transistors in Grid-Connected Voltage Source Converters funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ecce.2014.6953780

Publication URI: http://dx.doi.org/10.1109/ecce.2014.6953780

Type: Conference/Paper/Proceeding/Abstract