An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe (2016)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.scriptamat.2015.11.010
Publication URI: http://dx.doi.org/10.1016/j.scriptamat.2015.11.010
Type: Journal Article/Review
Parent Publication: Scripta Materialia