An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe (2016)
Attributed to:
A Study of the Combined Effects of Displacement Damage and Helium Accumulation in Model Nuclear Materials
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.scriptamat.2015.11.010
Publication URI: http://dx.doi.org/10.1016/j.scriptamat.2015.11.010
Type: Journal Article/Review
Parent Publication: Scripta Materialia