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2T2M memristor based TCAM cell for low power applications (2015)

First Author: Yang Y

Attributed to: Yield and reliability enhancement techniques for novel memory devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/dtis.2015.7127379

Publication URI: http://dx.doi.org/10.1109/dtis.2015.7127379

Type: Conference/Paper/Proceeding/Abstract