RAEF: A Power Normalized System-Level Reliability Analysis and Estimation Framework (2012)

First Author: Shafik R
Attributed to:  Process Variation Aware Synthesis of Nano-CMOS Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/isvlsi.2012.42

Publication URI: http://dx.doi.org/10.1109/isvlsi.2012.42

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4673-2234-8