Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template (2016)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4941444
Publication URI: http://dx.doi.org/10.1063/1.4941444
Type: Journal Article/Review
Parent Publication: AIP Advances
Issue: 2