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SPICE Modeling of the Scaling of Resonant Tunneling Diodes and the Effects of Sidewall Leakage (2012)

First Author: Ternent G

Attributed to: Silicon Resonant Tunnelling Diodes and Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2219867

Publication URI: http://dx.doi.org/10.1109/ted.2012.2219867

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 12