SPICE Modeling of the Scaling of Resonant Tunneling Diodes and the Effects of Sidewall Leakage (2012)
Attributed to:
Silicon Resonant Tunnelling Diodes and Circuits
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2219867
Publication URI: http://dx.doi.org/10.1109/ted.2012.2219867
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 12