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Analysis of Ge micro-cavities with in-plane tensile strains above 2 % (2016)

First Author: Millar R

Attributed to: Engineering Quantum Technology Systems on a Silicon Platform funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/oe.24.004365

PubMed Identifier: 29092264

Publication URI: http://europepmc.org/abstract/MED/29092264

Type: Journal Article/Review

Parent Publication: Optics Express

Issue: 5

ISSN: 1094-4087