Analysis of Ge micro-cavities with in-plane tensile strains above 2. (2016)
Attributed to:
Engineering Quantum Technology Systems on a Silicon Platform
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/oe.24.004365
PubMed Identifier: 29092264
Publication URI: http://europepmc.org/abstract/MED/29092264
Type: Journal Article/Review
Volume: 24
Parent Publication: Optics express
Issue: 5
ISSN: 1094-4087