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Fault detection and repair of DSC arrays through memristor sensing (2015)

First Author: Mathew J

Attributed to: Yield and reliability enhancement techniques for novel memory devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/dft.2015.7315127

Publication URI: http://dx.doi.org/10.1109/dft.2015.7315127

Type: Conference/Paper/Proceeding/Abstract