Improved Testing Capability of the Model-Assisted Testing Scheme for a Modular Multilevel Converter (2016)
Attributed to:
Underpinning Power Electronics 2012: Components Theme
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2016.2514439
Publication URI: http://dx.doi.org/10.1109/tpel.2016.2514439
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Power Electronics
Issue: 11