Structural, electrical and optical characterization of MOCVD grown In-rich InGaN layers (2012)

First Author: Tuna Ö
Attributed to:  Structural and electronic properties of InN surfaces and interfaces funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.jcrysgro.2012.07.040

Publication URI: http://dx.doi.org/10.1016/j.jcrysgro.2012.07.040

Type: Journal Article/Review

Parent Publication: Journal of Crystal Growth