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Topography-free sample for thermal spatial response measurement of scanning thermal microscopy (2015)

First Author: Ge Y
Attributed to:  Scanning thermal conduction microscopy with dual cantilever resistive probe funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1116/1.4933172

Publication URI: http://dx.doi.org/10.1116/1.4933172

Type: Journal Article/Review

Parent Publication: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Issue: 6