Hard x-ray photoelectron spectroscopy as a probe of the intrinsic electronic properties of CdO (2014)
Attributed to:
Surface and interface electronic properties of emerging oxide semiconductors: a feasibility study of CdO
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.89.035203
Publication URI: http://dx.doi.org/10.1103/physrevb.89.035203
Type: Journal Article/Review
Parent Publication: Physical Review B
Issue: 3